IIT Bombay, Mumbai
Souvik Mahapatra is a Professor of Electrical Engineering at IIT Bombay. He received his PhD from IIT Bombay in 1999 and was a researcher at the Bell Laboratories, USA, during 2000–01 before rejoining IIT Bombay in 2002. His research interests include reliability of CMOS devices and circuits. He has received many awards including the INAE-Young Engineer Award (2004), the Tan Chin Tuan Fellowship by Singapore Government (2008), the PRL-Vikram Sarabhai Award (2014), and the Erasmus Mundus Fellowship (visiting fellow at IMEC, Belgium, 2015). He is a Fellow of the Institute of Electrical and Electronics Engineers and Indian National Academy of Engineering. He was elected a Fellow of the Indian Academy of Sciences in 2018. ***
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Reliability of CMOS IC chips – from atoms to processors
Integrated circuit (IC) chips are ubiquitous in all electronic products used today. The semiconductor industry has made tremendous progress in delivering ICs with increased performance over the years, resulting in better products. However, during operation, these ICs degrade over time and eventually fail. Therefore, the industry must ensure that the reliability (or rate of failure) of these ICs is not compromised when a new technology is developed and delivered and that the products should operate over their specified usage life. In this talk, the speaker will discuss the methodologies and models for predetermining the ageing and failure of these chips – from technology (transistors) to full chip (circuits) level. These methods are helpful in accessing and rectifying potential reliability issues during CMOS (complementary metal-oxide-semiconductor) technology qualification.